Yokohira, Tokumi - OU Author List - OKAYAMA UNIVERSITY SCIENTIFIC ACHIEVEMENT REPOSITORY

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CMOS floating gate defect detection using I/sub DDQ/ test with DC power supply superposed by AC component

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\| Kobayashi, Toshifumi\| Hondo, Tsutomu\|
Published Date	2002-11
Publication Title	Test Symposium
Content Type	Journal Article

Performance Improvement of TCP using Performance Enhancing Proxies — Effect of Premature ACK Transmission Timing on Throughput —

Author	Osada, Shigeyuki\| Yokohira, Tokumi\| Hui, Wang\| Okayama, Kiyohiko\| Yamai, Nariyoshi\|
Published Date	2005-11
Publication Title	Information and Telecommunication Technologies
Content Type	Journal Article

A test methodology for interconnect structures of LUT-based FPGAs

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\| Inoue, Tomoo\| Fujiwara, Hideo\|
Published Date	1996-11
Publication Title	Test Symposium
Content Type	Journal Article

Improvement of detectability for CMOS floating gate defects in supply current test

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\| Kobayashi, Toshifumi\| Hondo, Tsutomu\|
Published Date	2003-11
Publication Title	Test Symposium
Content Type	Journal Article

A Framework for Mobile Agent Systems with the Capability of Preceding and Following Users

Author	Yokohira, Tokumi\| Okayama, Kiyohiko\| Murakami, Takashi\| Takarako, Kayo\|
Published Date	2005-11
Publication Title	Information and Telecommunication Technologies
Content Type	Journal Article

A framework for mobile agent systems with the capability of preceding and following users

Author	Yokohira, Tokumi\| Okayama, Kiyohiko\| Murakami, Takashi\| Takarako, Kayo\|
Published Date	2005-11
Publication Title	Information and Telecommunication Technologies
Content Type	Journal Article

Fault tolerant packet-switched network design and Its sensitivity

Author	Yokohira, Tokumi\| Sugano, Masashi\| Nishida, Takeshi\| Miyahara, Hideo\|
Published Date	1991-05-07
Publication Title	Reliability
Volume	volume40
Issue	issue4
Content Type	Journal Article

Testing for the programming circuit of LUT-based FPGAs

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\| Inoue, Tomoo\| Fujiwara, Hideo\|
Published Date	1997-11-17
Publication Title	Test Symposium
Content Type	Journal Article

A minimal-state processing search algorithm for satisfiability problems

Author	Funabiki, Nobuo\| Yokohira, Tokumi\| Nakanishi, Toru\| Tajima, Shigeto\| Higashino, Teruo\|
Published Date	2001-10
Publication Title	Systems
Volume	volume4
Content Type	Journal Article

Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

Author	Yokohira, Tokumi\| Shimizu, Toshimi\| Michinishi, Hiroyuki\| Sugiyama, Yuji\| Okamoto, Takuji\|
Published Date	1994-11-15
Publication Title	Test Symposium
Content Type	Journal Article

Minimum Verification test set for combinational circuit

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\|
Published Date	1992-11-26
Publication Title	Test Symposium
Content Type	Journal Article

A test methodology for interconnect structures of LUT-based FPGAs

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\| Inoue, Tomoo\| Fujiwara, Hideo\|
Published Date	1996-11
Publication Title	Test Symposium
Content Type	Journal Article

Proof that akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\|
Published Date	1993-11
Publication Title	Test Symposium
Content Type	Journal Article

Functional Testing of an ALU

Author	Yokohira, Tokumi\|
Published Date	1990-03-29
Publication Title	Memoirs of the Faculty of Engineering, Okayama University
Volume	volume24
Issue	issue2
Content Type	Departmental Bulletin Paper