| ID | 30027 |
| FullText URL | |
| Author |
Michinishi, Hiroyuki
Okamoto, Takuji
|
| Abstract | In this paper, we prove that Akers' test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers' test pattern generator can generate an MLTS for such CUT |
| Keywords | automatic testing
built-in self test
combinational circuits
logic testing
matrix algebra
minimisation
|
| Note | Digital Object Identifier: 10.1109/ATS.1993.398773
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1993., Proceedings of the Second Asian, 16-18 Nov. 1993, Pages 14-19. Publisher URL:http://dx.doi.org/10.1109/ATS.1993.398773 Copyright © 1993 IEEE. All rights reserved. |
| Published Date | 1993-11
|
| Publication Title |
Test Symposium
|
| Start Page | 14
|
| End Page | 19
|
| Content Type |
Journal Article
|
| language |
English
|
| Refereed |
True
|
| DOI | |
| Submission Path | industrial_engineering/62
|
