Yokohira, Tokumi - OU Author List - OKAYAMA UNIVERSITY SCIENTIFIC ACHIEVEMENT REPOSITORY

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Deep Reinforcement Learning Enabled Adaptive Virtual Machine Migration Control in Multi-Stage Information Processing Systems

FullText URL	fulltext.pdf
Author	Fukushima, Yukinobu\| Koujitani, Yuki\| Nakane, Kazutoshi\| Tarutani, Yuya\| Wu, Celimuge\| Ji, Yusheng\| Yokohira, Tokumi\| Murase, Tutomu\|
Keywords	Multi-stage information processing system VM migration control Deep reinforcement learning Deep Deterministic Policy Gradient (DDPG)
Note	https://www.thinkmind.org/library/NetSer/NetSer_v17_n34_2024/netser_v17_n34_2024_7.html\|
Published Date	2024-12-30
Publication Title	International Journal On Advances in Networks and Services
Volume	volume17
Issue	issue3-4
Publisher	IARIA
Start Page	116
End Page	125
ISSN	1942-2644
Content Type	Journal Article
language	English
OAI-PMH Set	岡山大学
Copyright Holders	© Copyright by authors
File Version	publisher

A Protection Scheme With Speech Processing Against Audio Adversarial Examples

FullText URL	fulltext.pdf
Author	Tarutani, Yuya\| Yamamoto, Taisei\| Fukushima, Yukinobu\| Yokohira, Tokumi\|
Keywords	Speech recognition system security audio adversarial example
Published Date	2024-09-25
Publication Title	IEEE Access
Volume	volume12
Publisher	Institute of Electrical and Electronics Engineers
Start Page	146551
End Page	146559
ISSN	2169-3536
Content Type	Journal Article
language	English
OAI-PMH Set	岡山大学
Copyright Holders	© 2024 The Authors.
File Version	publisher
DOI	10.1109/ACCESS.2024.3467224
Web of Science KeyUT	001337453100001
Related Url	isVersionOf https://doi.org/10.1109/ACCESS.2024.3467224

Application of a Deep Reinforcement Learning Algorithm to Virtual Machine Migration Control in Multi-Stage Information Processing Systems

FullText URL	fulltext20240530-01.pdf
Author	Fukushima, Yukinobu\| Koujitani, Yuki\| Nakane, Kazutoshi\| Tarutani, Yuta\| Wu, Celimuge\| Ji, Yusheng\| Yokohira, Tokumi\| Murase, Tutomu\|
Keywords	Multi-stage information processing system VM migration control Deep reinforcement learning Deep Deterministic Policy Gradient (DDPG)
Note	https://www.thinkmind.org/library/ICN/ICN_2024/icn_2024_1_30_30019.html\|
Published Date	2024-05-26
Publication Title	ICN 2024 : The Twenty-Third International Conference on Networks
Publisher	IARIA
Start Page	13
End Page	18
ISSN	2308-4413
Content Type	Conference Paper
language	English
OAI-PMH Set	岡山大学
Copyright Holders	Copyright (c) IARIA, 2024
File Version	publisher

CMOS floating gate defect detection using I/sub DDQ/ test with DC power supply superposed by AC component

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\| Kobayashi, Toshifumi\| Hondo, Tsutomu\|
Published Date	2002-11
Publication Title	Test Symposium
Content Type	Journal Article

Performance Improvement of TCP using Performance Enhancing Proxies — Effect of Premature ACK Transmission Timing on Throughput —

FullText URL	fulltext.pdf
Author	Osada, Shigeyuki\| Yokohira, Tokumi\| Hui, Wang\| Okayama, Kiyohiko\| Yamai, Nariyoshi\|
Keywords	PEP Premature ACK TCP watermark
Note	Published with permission from the copyright holder. This is the institute's copy, as published in Information and Telecommunication Technologies, 2005. APSITT 2005 Proceedings. 6th Asia-Pacific Symposium on, 9-10 Nov. 2005, Pages 7-12. Publisher URL:http://ieeexplore.ieee.org/search/wrapper.jsp?arnumber=1593429 Copyright © 2005 IEEE. All rights reserved.\|
Published Date	2005-11
Publication Title	Information and Telecommunication Technologies
Start Page	7
End Page	12
Content Type	Journal Article
language	English
OAI-PMH Set	岡山大学
DOI	10.1109/APSITT.2005.203622
Related Url	isVersionOf https://doi.org/10.1109/APSITT.2005.203622

A test methodology for interconnect structures of LUT-based FPGAs

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\| Inoue, Tomoo\| Fujiwara, Hideo\|
Published Date	1996-11
Publication Title	Test Symposium
Content Type	Journal Article

Improvement of detectability for CMOS floating gate defects in supply current test

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\| Kobayashi, Toshifumi\| Hondo, Tsutomu\|
Published Date	2003-11
Publication Title	Test Symposium
Content Type	Journal Article

A Framework for Mobile Agent Systems with the Capability of Preceding and Following Users

FullText URL	fulltext.pdf
Author	Yokohira, Tokumi\| Okayama, Kiyohiko\| Murakami, Takashi\| Takarako, Kayo\|
Note	Published with permission from the copyright holder. This is the institute's copy, as published in Information and Telecommunication Technologies, 2005. APSITT 2005 Proceedings. 6th Asia-Pacific Symposium on, 9-10 Nov. 2005, Pages 89-94. Publisher URL:http://ieeexplore.ieee.org/search/wrapper.jsp?arnumber=1593443 Copyright © 2005 IEEE. All rights reserved.\|
Published Date	2005-11
Publication Title	Information and Telecommunication Technologies
Start Page	89
End Page	94
Content Type	Journal Article
language	English
OAI-PMH Set	岡山大学
File Version	publisher
DOI	10.1109/apsitt.2005.203636

A framework for mobile agent systems with the capability of preceding and following users

FullText URL	fulltext.pdf
Author	Yokohira, Tokumi\| Okayama, Kiyohiko\| Murakami, Takashi\| Takarako, Kayo\|
Note	Published with permission from the copyright holder. This is the institute's copy, as published in Information and Telecommunication Technologies, 2005. APSITT 2005 Proceedings. 6th Asia-Pacific Symposium on, 09-10 Nov. 2005, Pages 89-94. Publisher URL:http://ieeexplore.ieee.org/search/wrapper.jsp?arnumber=1593443 Copyright © 2005 IEEE. All rights reserved.\|
Published Date	2005-11
Publication Title	Information and Telecommunication Technologies
Start Page	89
End Page	94
Content Type	Journal Article
language	English
OAI-PMH Set	岡山大学
File Version	publisher
DOI	10.1109/apsitt.2005.203636

Fault tolerant packet-switched network design and Its sensitivity

Author	Yokohira, Tokumi\| Sugano, Masashi\| Nishida, Takeshi\| Miyahara, Hideo\|
Published Date	1991-05-07
Publication Title	Reliability
Volume	volume40
Issue	issue4
Content Type	Journal Article

Testing for the programming circuit of LUT-based FPGAs

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\| Inoue, Tomoo\| Fujiwara, Hideo\|
Published Date	1997-11-17
Publication Title	Test Symposium
Content Type	Journal Article

A minimal-state processing search algorithm for satisfiability problems

Author	Funabiki, Nobuo\| Yokohira, Tokumi\| Nakanishi, Toru\| Tajima, Shigeto\| Higashino, Teruo\|
Published Date	2001-10
Publication Title	Systems
Volume	volume4
Content Type	Journal Article

Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

Author	Yokohira, Tokumi\| Shimizu, Toshimi\| Michinishi, Hiroyuki\| Sugiyama, Yuji\| Okamoto, Takuji\|
Published Date	1994-11-15
Publication Title	Test Symposium
Content Type	Journal Article

Minimum Verification test set for combinational circuit

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\|
Published Date	1992-11-26
Publication Title	Test Symposium
Content Type	Journal Article

A test methodology for interconnect structures of LUT-based FPGAs

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\| Inoue, Tomoo\| Fujiwara, Hideo\|
Published Date	1996-11
Publication Title	Test Symposium
Content Type	Journal Article

Proof that akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

Author	Michinishi, Hiroyuki\| Yokohira, Tokumi\| Okamoto, Takuji\|
Published Date	1993-11
Publication Title	Test Symposium
Content Type	Journal Article

Functional Testing of an ALU

JaLCDOI	10.18926/15505
FullText URL	Mem_Fac_Eng_OU_24_2_89.pdf
Author	Yokohira, Tokumi\|
Abstract	This paper considers a test set for an ALU with look ahead carry generators(LCGs). The ALU is logically partitioned into two groups of blocks, the group of one-bit operation units and LCG group. Each group is tested in parallel and exhaustively, independent of the other. And an easily testable design is applied to several blocks for decreasing the number of the input combinations of them. Under the easily testable design, a minimum test set for each group is generated, and the upper and lower bounds for a minimum test for the ALU are derived. The difference of the lower and upper bounds is not large, and a test set whose number of test vectors is equal to the upper bound can be easily obtained as the union of minimum test sets for two groups. Hence, the union can be used as a complete and practical test set for the ALU.
Publication Title	Memoirs of the Faculty of Engineering, Okayama University
Published Date	1990-03-29
Volume	volume24
Issue	issue2
Start Page	89
End Page	98
ISSN	0475-0071
language	English
File Version	publisher
NAID	120002307212