ID | 30027 |
フルテキストURL | |
著者 |
Michinishi, Hiroyuki
Okayama University
Okamoto, Takuji
Okayama University
|
抄録 | In this paper, we prove that Akers' test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers' test pattern generator can generate an MLTS for such CUT |
キーワード | automatic testing
built-in self test
combinational circuits
logic testing
matrix algebra
minimisation
|
備考 | Digital Object Identifier: 10.1109/ATS.1993.398773
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1993., Proceedings of the Second Asian, 16-18 Nov. 1993, Pages 14-19. Publisher URL:http://dx.doi.org/10.1109/ATS.1993.398773 Copyright © 1993 IEEE. All rights reserved. |
発行日 | 1993-11
|
出版物タイトル |
Test Symposium
|
開始ページ | 14
|
終了ページ | 19
|
資料タイプ |
学術雑誌論文
|
言語 |
英語
|
査読 |
有り
|
DOI | |
Submission Path | industrial_engineering/62
|