Proof that akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

ID	30027
フルテキストURL	fulltext.pdf 667 KB
著者	Michinishi, Hiroyuki Okayama University Yokohira, Tokumi Okayama University Kaken ID publons researchmap Okamoto, Takuji Okayama University
抄録	In this paper, we prove that Akers' test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers' test pattern generator can generate an MLTS for such CUT
キーワード	automatic testing built-in self test combinational circuits logic testing matrix algebra minimisation
備考	Digital Object Identifier: 10.1109/ATS.1993.398773 Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1993., Proceedings of the Second Asian, 16-18 Nov. 1993, Pages 14-19. Publisher URL:http://dx.doi.org/10.1109/ATS.1993.398773 Copyright © 1993 IEEE. All rights reserved.
発行日	1993-11
出版物タイトル	Test Symposium
開始ページ	14
終了ページ	19
資料タイプ	学術雑誌論文
言語	英語
査読	有り
DOI	10.1109/ATS.1993.398773
Submission Path	industrial_engineering/62