JaLCDOI 10.18926/15505
FullText URL Mem_Fac_Eng_OU_24_2_89.pdf
Author Yokohira, Tokumi|
Abstract This paper considers a test set for an ALU with look ahead carry generators(LCGs). The ALU is logically partitioned into two groups of blocks, the group of one-bit operation units and LCG group. Each group is tested in parallel and exhaustively, independent of the other. And an easily testable design is applied to several blocks for decreasing the number of the input combinations of them. Under the easily testable design, a minimum test set for each group is generated, and the upper and lower bounds for a minimum test for the ALU are derived. The difference of the lower and upper bounds is not large, and a test set whose number of test vectors is equal to the upper bound can be easily obtained as the union of minimum test sets for two groups. Hence, the union can be used as a complete and practical test set for the ALU.
Publication Title Memoirs of the Faculty of Engineering, Okayama University
Published Date 1990-03-29
Volume volume24
Issue issue2
Start Page 89
End Page 98
ISSN 0475-0071
language 英語
File Version publisher
NAID 120002307212
Author Yokohira, Tokumi| Sugano, Masashi| Nishida, Takeshi| Miyahara, Hideo|
Published Date 1991-05-07
Publication Title Reliability
Volume volume40
Issue issue4
Content Type Journal Article
Author Michinishi, Hiroyuki| Yokohira, Tokumi| Okamoto, Takuji|
Published Date 1992-11-26
Publication Title Test Symposium
Content Type Journal Article
Author Michinishi, Hiroyuki| Yokohira, Tokumi| Okamoto, Takuji|
Published Date 1993-11
Publication Title Test Symposium
Content Type Journal Article
Author Yokohira, Tokumi| Shimizu, Toshimi| Michinishi, Hiroyuki| Sugiyama, Yuji| Okamoto, Takuji|
Published Date 1994-11-15
Publication Title Test Symposium
Content Type Journal Article
Author Michinishi, Hiroyuki| Yokohira, Tokumi| Okamoto, Takuji| Inoue, Tomoo| Fujiwara, Hideo|
Published Date 1996-11
Publication Title Test Symposium
Content Type Journal Article
Author Michinishi, Hiroyuki| Yokohira, Tokumi| Okamoto, Takuji| Inoue, Tomoo| Fujiwara, Hideo|
Published Date 1996-11
Publication Title Test Symposium
Content Type Journal Article
Author Michinishi, Hiroyuki| Yokohira, Tokumi| Okamoto, Takuji| Inoue, Tomoo| Fujiwara, Hideo|
Published Date 1997-11-17
Publication Title Test Symposium
Content Type Journal Article
Author Funabiki, Nobuo| Yokohira, Tokumi| Nakanishi, Toru| Tajima, Shigeto| Higashino, Teruo|
Published Date 2001-10
Publication Title Systems
Volume volume4
Content Type Journal Article
Author Michinishi, Hiroyuki| Yokohira, Tokumi| Okamoto, Takuji| Kobayashi, Toshifumi| Hondo, Tsutomu|
Published Date 2002-11
Publication Title Test Symposium
Content Type Journal Article
Author Michinishi, Hiroyuki| Yokohira, Tokumi| Okamoto, Takuji| Kobayashi, Toshifumi| Hondo, Tsutomu|
Published Date 2003-11
Publication Title Test Symposium
Content Type Journal Article
Author Osada, Shigeyuki| Yokohira, Tokumi| Hui, Wang| Okayama, Kiyohiko| Yamai, Nariyoshi|
Published Date 2005-11
Publication Title Information and Telecommunication Technologies
Content Type Journal Article
Author Yokohira, Tokumi| Okayama, Kiyohiko| Murakami, Takashi| Takarako, Kayo|
Published Date 2005-11
Publication Title Information and Telecommunication Technologies
Content Type Journal Article
Author Yokohira, Tokumi| Okayama, Kiyohiko| Murakami, Takashi| Takarako, Kayo|
Published Date 2005-11
Publication Title Information and Telecommunication Technologies
Content Type Journal Article