| ID | 8099 |
| Eprint ID | 8099
|
| FullText URL | |
| Title Alternative | SiC及びSi/遷移金属(Ti, Ni)薄膜系の軟X線放出分光法及び光電子放出像による評価
|
| Author |
Labis, Joselito Puzon
|
| Note | 掲載順位 47
|
| Published Date | 2002-03-25
|
| Publication Title | |
| Content Type |
Thesis or Dissertation
|
| Grant Number | 甲第2342号
|
| Granted Date | 2002-03-25
|
| Thesis Type |
Doctor of Philosophy in Science
|
| Grantor | 岡山大学
|
| language |
Japanese
|
| File Version | none
|
| Refereed |
Unknown
|
