REPO

Memoirs of the Faculty of Engineering, Okayama University volume26 issue2
1992-03-28 発行

Preparation and Characterization of Ti(2)O(3) Films Deposited on Sapphire Substrate by Activated Reactive Evaporation Method

Sakata Naoki
Miura, Yoshinari
Publication Date
1992-03-28
Abstract
(001)-oriented Ti(2)O(3) films were epitaxially grown on a(001)-face of sapphire single-crystalline substrate by an activated reactive evaporation method. The formation ranges of stoichiometric and nonstoichiometric Ti(2)O(3) films were determined as a function of the substrate temperature (Ts), the oxygen pressure (Po(2)) and the deposition rate. Stoichiometric Ti(2)O(3) films were grown at Ts≧673K under Po(2)≧1.0×10(-4)Torr, which showed the metal-insulator transition with a sharp change in electrical resistivity from 3.5×10(-2) to 2.6×10(-3)Ωcm at 361K. Nonstoichiometric films prepared under less oxidized conditions did not exhibit the transition. The nonstoichiometry of the Ti(2)O(3)films was discussed in terms of excess Ti ions.
ISSN
0475-0071
NCID
AA10699856
NAID