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ID 48738
フルテキストURL
著者
Muro, Takayuki Japan Synchrotron Radiation Research Institute (JASRI)
Kato, yukako Japan Synchrotron Radiation Research Institute (JASRI)
Matsushita, Tomohiro Japan Synchrotron Radiation Research Institute (JASRI)
Kinoshita, Toyohiko Japan Synchrotron Radiation Research Institute (JASRI)
Watanabe, Yoshio Japan Synchrotron Radiation Research Institute (JASRI)
Okazaki, Hiroyuki The Graduate School of Natural Science and Technology, Okayama University
Yokoya, Takayoshi The Graduate School of Natural Science and Technology, Okayama University
Sekiyama, Akira Graduate School of Engineering Science, Osaka University
Suga, higemasa Graduate School of Engineering Science, Osaka University
抄録
A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X-ray synchrotron radiation with a spot size of ~40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.
キーワード
angle-resolved photoemission spectroscopy (ARPES)
soft X-ray
small crystal
microcleaving
micropositioning
発行日
2011-11
出版物タイトル
Journal of Synchrotron Radiation
18巻
6号
出版者
International Union of Crystallography
開始ページ
879
終了ページ
884
ISSN
0909-0495
NCID
AA11022317
資料タイプ
学術雑誌論文
プロジェクト
エネルギー環境新素材拠点
オフィシャル URL
http://scripts.iucr.org/cgi-bin/paper?S0909049511034418
言語
English
著作権者
© International Union of Crystallography
論文のバージョン
publisher
査読
有り
DOI
PubMed ID
Web of Sience KeyUT