ID | 48738 |
FullText URL | |
Author |
Muro, Takayuki
Kato, yukako
Matsushita, Tomohiro
Kinoshita, Toyohiko
Watanabe, Yoshio
Okazaki, Hiroyuki
Sekiyama, Akira
Suga, higemasa
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Abstract | A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X-ray synchrotron radiation with a spot size of ~40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.
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Keywords | angle-resolved photoemission spectroscopy (ARPES)
soft X-ray
small crystal
microcleaving
micropositioning
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Published Date | 2011-11
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Publication Title |
Journal of Synchrotron Radiation
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Volume | volume18
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Issue | issue6
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Publisher | International Union of Crystallography
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Start Page | 879
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End Page | 884
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ISSN | 0909-0495
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NCID | AA11022317
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Content Type |
Journal Article
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Project |
Research Center of New Functional Materials for Energy Production, Storage, and Transport
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Official Url | http://scripts.iucr.org/cgi-bin/paper?S0909049511034418
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language |
English
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Copyright Holders | © International Union of Crystallography
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File Version | publisher
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Refereed |
True
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DOI | |
PubMed ID | |
Web of Science KeyUT |