| ID | 34056 |
| フルテキストURL | |
| 著者 |
Michinishi, Hiroyuki
Okayama University of Science
Okamoto, Takuji
Okayama University of Science
Kobayashi, Toshifumi
Mitsubishi Electric Company Limited
Hondo, Tsutomu
Sharp Takaya Electronics Industry Company Limited
|
| 抄録 | We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments. |
| キーワード | CMOS logic circuits
built-in self test
equivalent circuits
integrated circuit testing
logic testing
|
| 備考 | Digital Object Identifier: 10.1109/ATS.2003.1250846
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 2003. ATS 2003. 12th Asian, 16-19 Nov. 2003, Pages 406-409. Publisher URL:http://dx.doi.org/10.1109/ATS.2003.1250846 Copyright © 2003 IEEE. All rights reserved. |
| 発行日 | 2003-11
|
| 出版物タイトル |
Test Symposium
|
| 開始ページ | 406
|
| 終了ページ | 409
|
| 資料タイプ |
学術雑誌論文
|
| 言語 |
英語
|
| 査読 |
有り
|
| DOI | |
| Submission Path | electrical_engineering/50
|
