Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

ID	30057
フルテキストURL	fulltext.pdf 585 KB
著者	Yokohira, Tokumi Okayama University Kaken ID publons researchmap Shimizu, Toshimi Okayama University Michinishi, Hiroyuki Okayama University Sugiyama, Yuji Okayama University Kaken ID publons researchmap Okamoto, Takuji Okayama University
抄録	In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2 w test patterns, where w is the maximum number of inputs on which any output depends
キーワード	combinational circuits logic testing matrix algebra
備考	Digital Object Identifier: 10.1109/ATS.1994.367218 Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1994., Proceedings of the Third Asian, 15-17 Nov 2006, Pages 280-285. Publisher URL:http://dx.doi.org/10.1109/ATS.1994.367218 Copyright © 1994 IEEE. All rights reserved.
発行日	1994-11-15
出版物タイトル	Test Symposium
開始ページ	280
終了ページ	285
資料タイプ	学術雑誌論文
言語	英語
査読	有り
DOI	10.1109/ATS.1994.367218
Submission Path	industrial_engineering/60