| ID | 30053 |
| フルテキストURL | |
| 著者 |
Michinishi, Hiroyuki
Okayama University
Okamoto, Takuji
Okayama University
|
| 抄録 | A sufficient condition under which a minimum verification test set (MVTS) for a combinational circuit has 2w elements is derived, where w is the maximum number of inputs on which any output depends, and an algorithm to find an NVTS with 2w elements for any CUT with up to four outputs is described |
| キーワード | automatic testing
built-in self test
combinatorial circuits
logic testing
|
| 備考 | Digital Object Identifier: 10.1109/ATS.1992.224428
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0), 26-27 Nov 1992, Pages 14-19. Publisher URL:http://dx.doi.org/10.1109/ATS.1992.224428 Copyright © 1992 IEEE. All rights reserved. |
| 発行日 | 1992-11-26
|
| 出版物タイトル |
Test Symposium
|
| 開始ページ | 14
|
| 終了ページ | 19
|
| 資料タイプ |
学術雑誌論文
|
| 言語 |
英語
|
| 査読 |
有り
|
| DOI | |
| Submission Path | industrial_engineering/63
|
