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Michinishi, Hiroyuki Okayama University of Science
Yokohira, Tokumi Okayama University
Okamoto, Takuji Okayama University of Science
Kobayashi, Toshifumi Mitsubishi Electric Company Limited
Hondo, Tsutomu Sharp Takaya Electronics Industry Company Limited
We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments.
CMOS logic circuits
built-in self test
integrated circuit testing
Digital Object Identifier: 10.1109/ATS.2003.1250846
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 2003. ATS 2003. 12th Asian, 16-19 Nov. 2003, Pages 406-409.
Copyright © 2003 IEEE. All rights reserved.