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ID 34056
フルテキストURL
著者
Michinishi, Hiroyuki Okayama University of Science
Yokohira, Tokumi Okayama University
Okamoto, Takuji Okayama University of Science
Kobayashi, Toshifumi Mitsubishi Electric Company Limited
Hondo, Tsutomu Sharp Takaya Electronics Industry Company Limited
抄録

We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments.

キーワード
CMOS logic circuits
built-in self test
equivalent circuits
integrated circuit testing
logic testing
備考
Digital Object Identifier: 10.1109/ATS.2003.1250846
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 2003. ATS 2003. 12th Asian, 16-19 Nov. 2003, Pages 406-409.
Publisher URL:http://dx.doi.org/10.1109/ATS.2003.1250846
Copyright © 2003 IEEE. All rights reserved.
発行日
2003-11
出版物タイトル
Test Symposium
開始ページ
406
終了ページ
409
資料タイプ
学術雑誌論文
言語
English
査読
有り
DOI
Submission Path
electrical_engineering/50