このエントリーをはてなブックマークに追加
ID 30057
フルテキストURL
著者
Yokohira, Tokumi Okayama University
Shimizu, Toshimi Okayama University
Michinishi, Hiroyuki Okayama University
Sugiyama, Yuji Okayama University
Okamoto, Takuji Okayama University
抄録

In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2 w test patterns, where w is the maximum number of inputs on which any output depends

キーワード
combinational circuits
logic testing
matrix algebra
備考
Digital Object Identifier: 10.1109/ATS.1994.367218
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1994., Proceedings of the Third Asian, 15-17 Nov 2006, Pages 280-285.
Publisher URL:http://dx.doi.org/10.1109/ATS.1994.367218
Copyright © 1994 IEEE. All rights reserved.
発行日
1994-11-15
出版物タイトル
Test Symposium
開始ページ
280
終了ページ
285
資料タイプ
学術雑誌論文
言語
English
査読
有り
DOI
Submission Path
industrial_engineering/60