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ID 30053
フルテキストURL
著者
Michinishi, Hiroyuki Okayama University
Yokohira, Tokumi Okayama University
Okamoto, Takuji Okayama University
抄録

A sufficient condition under which a minimum verification test set (MVTS) for a combinational circuit has 2w elements is derived, where w is the maximum number of inputs on which any output depends, and an algorithm to find an NVTS with 2w elements for any CUT with up to four outputs is described

キーワード
automatic testing
built-in self test
combinatorial circuits
logic testing
備考
Digital Object Identifier: 10.1109/ATS.1992.224428
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0), 26-27 Nov 1992, Pages 14-19.
Publisher URL:http://dx.doi.org/10.1109/ATS.1992.224428
Copyright © 1992 IEEE. All rights reserved.
発行日
1992-11-26
出版物タイトル
Test Symposium
開始ページ
14
終了ページ
19
資料タイプ
学術雑誌論文
言語
English
査読
有り
DOI
Submission Path
industrial_engineering/63