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ID 30027
フルテキストURL
著者
Michinishi, Hiroyuki Okayama University
Yokohira, Tokumi Okayama University
Okamoto, Takuji Okayama University
抄録

In this paper, we prove that Akers' test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers' test pattern generator can generate an MLTS for such CUT

キーワード
automatic testing
built-in self test
combinational circuits
logic testing
matrix algebra
minimisation
備考
Digital Object Identifier: 10.1109/ATS.1993.398773
Published with permission from the copyright holder. This is the institute's copy, as published in Test Symposium, 1993., Proceedings of the Second Asian, 16-18 Nov. 1993, Pages 14-19.
Publisher URL:http://dx.doi.org/10.1109/ATS.1993.398773
Copyright © 1993 IEEE. All rights reserved.
発行日
1993-11
出版物タイトル
Test Symposium
開始ページ
14
終了ページ
19
資料タイプ
学術雑誌論文
言語
English
査読
有り
DOI
Submission Path
industrial_engineering/62