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ID 15505
Eprint ID
15505
フルテキストURL
著者
横平 徳美 Department of Information Technology
抄録
This paper considers a test set for an ALU with look ahead carry generators(LCGs). The ALU is logically partitioned into two groups of blocks, the group of one-bit operation units and LCG group. Each group is tested in parallel and exhaustively, independent of the other. And an easily testable design is applied to several blocks for decreasing the number of the input combinations of them. Under the easily testable design, a minimum test set for each group is generated, and the upper and lower bounds for a minimum test for the ALU are derived. The difference of the lower and upper bounds is not large, and a test set whose number of test vectors is equal to the upper bound can be easily obtained as the union of minimum test sets for two groups. Hence, the union can be used as a complete and practical test set for the ALU.
発行日
1990-03-29
出版物タイトル
Memoirs of the Faculty of Engineering, Okayama University
出版物タイトル(別表記)
岡山大学工学部紀要
24巻
2号
出版者
Faculty of Engineering, Okayama University
出版者(別表記)
岡山大学工学部
開始ページ
89
終了ページ
98
ISSN
0475-0071
NCID
AA10699856
資料タイプ
紀要論文
言語
English
論文のバージョン
publisher
査読
無し
Eprints Journal Name
mfe