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ID 48738
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Author
Muro, Takayuki
Kato, yukako
Matsushita, Tomohiro
Kinoshita, Toyohiko
Watanabe, Yoshio
Okazaki, Hiroyuki
Sekiyama, Akira
Suga, higemasa
Abstract
A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X-ray synchrotron radiation with a spot size of ~40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.
Keywords
angle-resolved photoemission spectroscopy (ARPES)
soft X-ray
small crystal
microcleaving
micropositioning
Published Date
2011-11
Publication Title
Journal of Synchrotron Radiation
Volume
volume18
Issue
issue6
Publisher
International Union of Crystallography
Start Page
879
End Page
884
ISSN
0909-0495
NCID
AA11022317
Content Type
Journal Article
Project
Research Center of New Functional Materials for Energy Production, Storage, and Transport
Official Url
http://scripts.iucr.org/cgi-bin/paper?S0909049511034418
language
英語
Copyright Holders
© International Union of Crystallography
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publisher
Refereed
True
DOI
PubMed ID
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