"Tokumi;Yokohira|","Functional Testing of an ALU","Memoirs of the Faculty of Engineering, Okayama University","0475-0071","1990-03-29","24","2","89","98","","","","http://escholarship.lib.okayama-u.ac.jp/15505",""
    "Tokumi;Yokohira|Masashi;Sugano|Takeshi;Nishida|Hideo;Miyahara|","Fault tolerant packet-switched network design and Its sensitivity","Reliability","","1991-05-07","40","4","452","460","","","","http://escholarship.lib.okayama-u.ac.jp/30123","10.1109/24.93767"
    "Hiroyuki;Michinishi|Tokumi;Yokohira|Takuji;Okamoto|","Minimum Verification test set for combinational circuit","Test Symposium","","1992-11-26","","","14","19","","","","http://escholarship.lib.okayama-u.ac.jp/30053","10.1109/ATS.1992.224428"
    "Hiroyuki;Michinishi|Tokumi;Yokohira|Takuji;Okamoto|","Proof that akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs","Test Symposium","","1993-11","","","14","19","","","","https://ousar.lib.okayama-u.ac.jp/30027","10.1109/ATS.1993.398773"
    "Tokumi;Yokohira|Toshimi;Shimizu|Hiroyuki;Michinishi|Yuji;Sugiyama|Takuji;Okamoto|","Minimum test sets for locally exhaustive testing of combinational circuits with five outputs","Test Symposium","","1994-11-15","","","280","285","","","","https://ousar.lib.okayama-u.ac.jp/30057","10.1109/ATS.1994.367218"
    "Hiroyuki;Michinishi|Tokumi;Yokohira|Takuji;Okamoto|Tomoo;Inoue|Hideo;Fujiwara|","A test methodology for interconnect structures of LUT-based FPGAs","Test Symposium","","1996-11","","","68","74","","","","http://escholarship.lib.okayama-u.ac.jp/34073","10.1109/ATS.1996.555139"
    "Hiroyuki;Michinishi|Tokumi;Yokohira|Takuji;Okamoto|Tomoo;Inoue|Hideo;Fujiwara|","A test methodology for interconnect structures of LUT-based FPGAs","Test Symposium","","1996-11","","","68","74","","","","http://escholarship.lib.okayama-u.ac.jp/30049","10.1109/ATS.1996.555139"
    "Hiroyuki;Michinishi|Tokumi;Yokohira|Takuji;Okamoto|Tomoo;Inoue|Hideo;Fujiwara|","Testing for the programming circuit of LUT-based FPGAs","Test Symposium","","1997-11-17","","","242","247","","","","https://ousar.lib.okayama-u.ac.jp/30096","10.1109/ATS.1997.643965"
    "Nobuo;Funabiki|Tokumi;Yokohira|Toru;Nakanishi|Shigeto;Tajima|Teruo;Higashino|","A minimal-state processing search algorithm for satisfiability problems","Systems","","2001-10","4","","2769","2774","","","","https://ousar.lib.okayama-u.ac.jp/30094","10.1109/ICSMC.2001.972986"
    "Hiroyuki;Michinishi|Tokumi;Yokohira|Takuji;Okamoto|Toshifumi;Kobayashi|Tsutomu;Hondo|","CMOS floating gate defect detection using I/sub DDQ/ test with DC power supply superposed by AC component","Test Symposium","","2002-11","","","417","422","","","","https://ousar.lib.okayama-u.ac.jp/34080","10.1109/ATS.2002.1181747"
    "Hiroyuki;Michinishi|Tokumi;Yokohira|Takuji;Okamoto|Toshifumi;Kobayashi|Tsutomu;Hondo|","Improvement of detectability for CMOS floating gate defects in supply current test","Test Symposium","","2003-11","","","406","409","","","","https://ousar.lib.okayama-u.ac.jp/34056","10.1109/ATS.2003.1250846"
    "Tokumi;Yokohira|Kiyohiko;Okayama|Takashi;Murakami|Kayo;Takarako|","A Framework for Mobile Agent Systems with the Capability of Preceding and Following Users","Information and Telecommunication Technologies","","2005-11","","","89","94","","","","http://escholarship.lib.okayama-u.ac.jp/34046","10.1109/apsitt.2005.203636"
    "Shigeyuki;Osada|Tokumi;Yokohira|Wang;Hui|Kiyohiko;Okayama|Nariyoshi;Yamai|","Performance Improvement of TCP using Performance Enhancing Proxies — Effect of Premature ACK Transmission Timing on Throughput —","Information and Telecommunication Technologies","","2005-11","","","7","12","isVersionOf https://doi.org/10.1109/APSITT.2005.203622","","","http://escholarship.lib.okayama-u.ac.jp/34075","10.1109/APSITT.2005.203622"
    "Tokumi;Yokohira|Kiyohiko;Okayama|Takashi;Murakami|Kayo;Takarako|","A framework for mobile agent systems with the capability of preceding and following users","Information and Telecommunication Technologies","","2005-11","","","89","94","","","","http://escholarship.lib.okayama-u.ac.jp/30125","10.1109/apsitt.2005.203636"