このエントリーをはてなブックマークに追加
ID 15681
JaLCDOI
Sort Key
3
FullText URL
Author
Honda Kazuo
Hosokawa Norio
Abstract
The diffracted intensity of X-ray depends upon several physical and geometrical factors such as structure, multiplicity, absorption and Lorentzpolarization and measuring conditions such as time constant and scanning speed of detector on counter method[l]. For analyzing on the X-ray stress measurement, especially, profile shape of X-ray diffraction which is affected by geometrical factors such as absorption and Lorentz-polarization is very important. In order to eliminate these factors affecting the stress measured by using X-ray, the correcting factors were introduced and those theoretical values were calculated. After this theoretical calculation, it is found that as the half value breadth increases the difference between the stress measured by using X-ray and the corrected one becomes larger and larger under same measuring condition. When the ideal diffracted intensity of X-ray is assumed Cauchy distribution the measured stress depends upon measuring condition for same specimen, but it is independent of measuring condition in Gauss, distribution. Consequently, it is found that the stress measured by using X-ray must be corrected under each measuring condition and the method of correction is made clear and proved experimentally in this paper.
Publication Title
Memoirs of the School of Engineering, Okayama University
Published Date
1976-01-27
Volume
volume10
Issue
issue2
Publisher
岡山大学工学部
Publisher Alternative
School of Engineering, Okayama University
Start Page
1
End Page
13
ISSN
0475-0071
NCID
AA00733903
Content Type
Departmental Bulletin Paper
OAI-PMH Set
岡山大学
language
英語
File Version
publisher
NAID
Eprints Journal Name
mfe