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ID 15505
Eprint ID
15505
FullText URL
Author
Abstract
This paper considers a test set for an ALU with look ahead carry generators(LCGs). The ALU is logically partitioned into two groups of blocks, the group of one-bit operation units and LCG group. Each group is tested in parallel and exhaustively, independent of the other. And an easily testable design is applied to several blocks for decreasing the number of the input combinations of them. Under the easily testable design, a minimum test set for each group is generated, and the upper and lower bounds for a minimum test for the ALU are derived. The difference of the lower and upper bounds is not large, and a test set whose number of test vectors is equal to the upper bound can be easily obtained as the union of minimum test sets for two groups. Hence, the union can be used as a complete and practical test set for the ALU.
Published Date
1990-03-29
Publication Title
Memoirs of the Faculty of Engineering, Okayama University
Publication Title Alternative
岡山大学工学部紀要
Volume
volume24
Issue
issue2
Publisher
Faculty of Engineering, Okayama University
Publisher Alternative
岡山大学工学部
Start Page
89
End Page
98
ISSN
0475-0071
NCID
AA10699856
Content Type
Departmental Bulletin Paper
language
英語
File Version
publisher
Refereed
False
Eprints Journal Name
mfe