ID | 8099 |
Eprint ID | 8099
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FullText URL | |
Title Alternative | SiC及びSi/遷移金属(Ti, Ni)薄膜系の軟X線放出分光法及び光電子放出像による評価
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Author |
Labis, Joselito Puzon
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Note | 掲載順位 47
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Published Date | 2002-03-25
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Publication Title | |
Content Type |
Thesis or Dissertation
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Grant Number | 甲第2342号
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Granted Date | 2002-03-25
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Thesis Type |
Doctor of Philosophy in Science
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Grantor | 岡山大学
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language |
Japanese
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File Version | none
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Refereed |
Unknown
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